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Applied Psychological Measurement

Applied Psychological Measurement


eISSN: 15523497 | ISSN: 01466216 | Current volume: 48 | Current issue: 3 Frequency: 8 Times/Year

For more than thirty years, Applied Psychological Measurement (APM) has led the measurement field in presenting cutting-edge methodologies and related empirical research. Whether the setting is educational, organizational, industrial, social, or clinical, APM focuses on ways to use the most current techniques to address measurement problems in the behavioral and social sciences.

Broad Coverage

Applied Psychological Measurement provides a complete picture of the measurement discipline. Its wide range of features keeps readers informed of all the latest developments that shape this evolving field of study. Among these features are:

  • articles reporting the latest empirical research and methodological developments
  • brief reports of exploratory, small-sample, or replication studies
  • computer program reviews of commercially available software packages used in applied measurement
  • book reviews of important new publications
  • announcements of statistical and measurement meetings, symposia, and workshops

To view some of the most influential topics covered in APM over the years, please view our "Influential Articles" index located on the journal's home page.

Special Issues

Applied Psychological Measurement regularly supplements its broad scope with special issues, guest edited by leading scholars, devoted to a single topic of emerging importance in measurement. Recent and forthcoming special issues focus on such topics as:

  • Polytomous item response theory
  • Latest developments in multidimensional item response theory
  • Optimal test assembly

Diverse Topics

From discussion of innovative measuring techniques to studies of validity and reliability methods, each issue of Applied Psychological Measurement features the most current explorations of measurement problems and solutions. Some of the important topics frequently covered in APM include item response theory, test equations and linking, reliability theory and methods, differential item functioning, measurement of change, algorithmic test construction, unidimensional and multidimensional scaling, validity methodology, computerized adaptive testing, Rasch models, person fit, and generalizability theory and methods.

International Perspective

Leading authorities in scholarly publication regularly rank Applied Psychological Measurement among the top journals in quantitative psychology. APM is one of the few journals in the field that presents a truly international perspective on measurement, publishing articles contributed by researchers from around the globe. Worldwide respect and renown is further enhanced through a strong partnership with SAGE Publications, an international leader in social and behavioral science publications.

This journal is a member of the Committee on Publication Ethics (COPE).

Applied Psychological Measurement publishes empirical research on the application of techniques of psychological measurement to substantive problems in all areas of psychology and related disciplines.

Editor
John Donoghue Educational Testing Service, USA
Associate Editors
Jimmy de la Torre University of Hong Kong, Hong Kong
Brian Habing University of South Carolina, USA
Chun Wang University of Washington, USA
Yi Zheng Arizona State University, USA
Book Review Editor
Cindy M. Walker University of Wisconsin - Milwaukee, USA
Computer Software Review Editor
Richard M. Luecht The University of North Carolina - Greensboro, USA
Computer Program Exchange Editor
Niels Waller University of Minnesota, Twin Cities, USA
Editorial Board
Terry A. Ackerman The University of North Carolina - Greensboro, USA
David Andrich University of Western Australia, Perth, Australia
Robert L. Brennan University of Iowa, USA
David V. Budescu Fordham University, USA
Yunxiao Chen Emory University, USA
Allan S. Cohen University of Georgia College of Social Work, USA
Robert Cudeck The Ohio State University, USA
Ying Cui University of Alberta, Canada
Fritz Drasgow University of Illinois at Urbana-Champaign, USA
Bert F. Green Johns Hopkins University, USA
Ronald K. Hambleton University of Massachusetts, Amherst, USA
Willem J. Heiser University of Leiden, Netherlands
Michelle Liou Institute of Statistical Science, Academia Sinica
Adam W. Meade North Carolina State University, USA
Eiji Muraki Tohoku University, Japan
David Rindskopf The University of New York, USA
Klaas Sijtsma Tilburg University, Netherlands
Stephen Stark University of South Florida, USA
Douglas Steinley University of Missouri - Columbia, USA
Hariharan Swaminathan University of Connecticut, USA
Yoshio Takane McGill University, Canada
Jonathan Templin University of Kansas, Lawrence, Kansas, USA
Bo Wang College Board, USA
Carol Woods University of Kansas, USA
Editors Emeritus
Mark L. Davison University of Minnesota, Twin Cities, USA
Mark D. Reckase Michigan State University, USA
David J. Weiss University of Minnesota - Twin Cities, USA
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